Design and characterization of CMOS/SOI image sensors

IEEE Transactions on Electron Devices

Volumn 54, Issue 3, 2007, Pages 468-475

  Brouk, Igor ^a   Alameh, Kamal ^b   Nemirovsky, Yael ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b EDITH COWAN UNIVERSITY   (Australia)

Author keywords

CMOS integrated circuits; Image sensors; Photodiodes; Silicon on insulator (SOI) technology

Indexed keywords

CHARACTERIZATION; CMOS INTEGRATED CIRCUITS; DARK CURRENTS; DESIGN; PHOTODIODES; QUANTUM EFFICIENCY; SILICON ON INSULATOR TECHNOLOGY; WSI CIRCUITS;

CMOS WAFERS; OPTICAL BANDWIDTH; SOI WAFERS;

IMAGE SENSORS;

EID: 33947630766     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.890585     Document Type: Article

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