Dimensional effects in CMOS photodiodes

Solid-State Electronics

Volumn 46, Issue 1, 2002, Pages 19-28

  Brouk, Igor ^a   Nemirovsky, Yael ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

CMOS photodiodes; Dark current; Noise; Photodiode image sensors; Quantum efficiency

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; IMAGE SENSORS; PHOTODIODES; QUANTUM EFFICIENCY; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; SUBSTRATES;

DARK CURRENTS;

CMOS INTEGRATED CIRCUITS;

EID: 0036132572     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(01)00282-9     Document Type: Article

References (9)

1. CMOS image sensor: Electronic camera-on-a-chip
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5. Comparative study of novel micromachined accelerometers employing MIDOS
6. Detection of optical and infrared radiation
7. Absorption coefficient of silicon for solar cell calculations