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Volumn 36, Issue 1, 2007, Pages 17-25

Effect of interfacial reaction on the tensile strength of Sn-3.5Ag/Ni-P and Sn-37Pb/Ni-P solder joints

Author keywords

Electroless nickel; Intermetallic compound (IMC); Lead free solder; Tensile strength

Indexed keywords

AGING TEMPERATURE; AGING TREATMENT; ELECTROLESS NICKEL; LEAD FREE SOLDERS;

EID: 33947538226     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0008-1     Document Type: Article
Times cited : (24)

References (33)
  • 3
    • 36148938452 scopus 로고    scopus 로고
    • WEEE, Directive of The European Parliament and of the Council on Waste Electrical and Electronic Equipment, on the, Brussels: Commission of The European Communities
    • WEEE, Directive of The European Parliament and of the Council on Waste Electrical and Electronic Equipment, on the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment (Brussels: Commission of The European Communities, 2000), pp. 59-83.
    • (2000) Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment , pp. 59-83
  • 9
  • 26
    • 0034821493 scopus 로고    scopus 로고
    • Y.-D. Jeon, K.-W. Paik, K-S. Bok, W.-S. Choi, and C.-L. Cho, Studies on Ni-Sn Intermetallic Compound and P-Rich Ni Layer at the Electroless Nickel UBM-Solder Interface and Their Effects on Flip Chip Solder Joint Reliability, Electronic Component and Technology Conf., 2001 Proc., 51st, pp. 1326-1332.
    • Y.-D. Jeon, K.-W. Paik, K-S. Bok, W.-S. Choi, and C.-L. Cho, Studies on Ni-Sn Intermetallic Compound and P-Rich Ni Layer at the Electroless Nickel UBM-Solder Interface and Their Effects on Flip Chip Solder Joint Reliability, Electronic Component and Technology Conf., 2001 Proc., 51st, pp. 1326-1332.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.