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Journal of Crystal Growth

Volumn 301-302, Issue SPEC. ISS., 2007, Pages 496-499

In situ spectroscopic ellipsometry and RHEED monitored growth of InN nanocolumns by molecular beam epitaxy

(4) Wang, Xinqiang a Che, Song Bek a Ishitani, Yoshihiro a Yoshikawa, Akihiko a

a CHIBA UNIVERSITY (Japan)

Author keywords

A1. Nanostructures; A3. Molecular beam epitaxy; B1. Nitrides

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; INDIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTOR QUANTUM DOTS; SPECTROSCOPIC ELLIPSOMETRY;

EX SITU MEASUREMENTS; IN SITU SPECTROSCOPIC ELLIPSOMETRY; NANOCOLUMNS; SELF ORGANIZED GROWTH;

NANOSTRUCTURED MATERIALS;

EID: 33947408117 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.11.111 Document Type: Article

Times cited : (11)

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