I DDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems

Volumn 9, Issue 2, 2004, Pages 159-198

  Sabade, Sagar S ^a   Walker, Duncan M ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

I DDQ test; I DDT test; VLSI testing

Indexed keywords

BUILT-IN CURRENT SENSORS (BICS); STATIC LEAKAGE CURRENT (IDDQ); TRANSIENT CURRENT (IDDT); VERY LOW VOLTAGE (VLV);

CMOS INTEGRATED CIRCUITS; DATABASE SYSTEMS; ELECTRIC CURRENT MEASUREMENT; FLIP FLOP CIRCUITS; LEAKAGE CURRENTS; PERFORMANCE; PROCESS CONTROL; RELIABILITY; SIGNAL TO NOISE RATIO; SILICON WAFERS;

INTEGRATED CIRCUIT TESTING;

EID: 2942566264     PISSN: 10844309     EISSN: None     Source Type: Journal    
DOI: 10.1145/989995.989997     Document Type: Review

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