Comparison of preferred orientation and stress in silver thin films on different substrates using x-ray diffraction

Journal of Applied Physics

Volumn 101, Issue 3, 2007, Pages

  Zoo, Yeongseok ^a   Alford, T L ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

POLYETHYLENE NAPHTHALATE (PEN); SUBSTRATE MORPHOLOGY; TEXTURE EVOLUTION;

FILM GROWTH; NAPHTHALENE; SILICA; SILVER; STRESS ANALYSIS; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 33847137704     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2401654     Document Type: Article

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