-
1
-
-
33846819609
-
-
Teer DG. In: Proceedings of the seventh international conference on ion and plasma assisted techniques, IPAT'89, Geneva, Switzerland, 1989, CEP Consultants Ltd, Edinburgh; 1989. p. 145.
-
-
-
-
2
-
-
33846812288
-
-
Teer DG. In: Proceedings of the first international symposium on sputtering and plasma processes, ISSP'91, Tokyo, 1991. p. 131.
-
-
-
-
7
-
-
0026389282
-
-
Valvoda V., Perry A.J., Hultman L., Musil J., and Kadlec S. Surf Coat Technol 49 (1991) 181
-
(1991)
Surf Coat Technol
, vol.49
, pp. 181
-
-
Valvoda, V.1
Perry, A.J.2
Hultman, L.3
Musil, J.4
Kadlec, S.5
-
8
-
-
84881162072
-
-
Elstner F., Ehrlich A., Gregengask H., Kupfer H., and Richter F. J Vac Sci Technol A 12 (1994) 476
-
(1994)
J Vac Sci Technol A
, vol.12
, pp. 476
-
-
Elstner, F.1
Ehrlich, A.2
Gregengask, H.3
Kupfer, H.4
Richter, F.5
-
15
-
-
0035899586
-
-
Yamakov V., Wolf D., Salazar M., Phillpot S.R., and Gieiter H. Acta Mater 49 (2001) 2713
-
(2001)
Acta Mater
, vol.49
, pp. 2713
-
-
Yamakov, V.1
Wolf, D.2
Salazar, M.3
Phillpot, S.R.4
Gieiter, H.5
-
20
-
-
33846838239
-
-
Gissler W, Jehn HA, editors. Euro courses, Mechanical and materials science, vol. 1. Advanced techniques for surface engineering. Dordrecht: Kluwer Academic Publishers; 1992.
-
-
-
-
23
-
-
0001149368
-
-
Ljungcrantz H., Oden M., Hultman L., Greene J.E., and Sundgren J.E. J Appl Phys 80 12 (1996) 6725
-
(1996)
J Appl Phys
, vol.80
, Issue.12
, pp. 6725
-
-
Ljungcrantz, H.1
Oden, M.2
Hultman, L.3
Greene, J.E.4
Sundgren, J.E.5
-
28
-
-
84957228669
-
-
Hultman L., Münz W.-D., Mussil J., Kladec K., Petrov I., and Greene J.E. J Vac Sci Technol A 9 (1991) 434
-
(1991)
J Vac Sci Technol A
, vol.9
, pp. 434
-
-
Hultman, L.1
Münz, W.-D.2
Mussil, J.3
Kladec, K.4
Petrov, I.5
Greene, J.E.6
-
32
-
-
0031556912
-
-
Zhao J.P., Wang X., Chen Z.Y., Yang S.Q., Shi T.S., and Liu X.H. J Phys D: Appl Phys 30 (1997) 5
-
(1997)
J Phys D: Appl Phys
, vol.30
, pp. 5
-
-
Zhao, J.P.1
Wang, X.2
Chen, Z.Y.3
Yang, S.Q.4
Shi, T.S.5
Liu, X.H.6
-
35
-
-
19444375302
-
-
Mahieu S., Ghekiere P., De Winter G., De Gryse R., Depla D., Van Tendeloo G., et al. Solid State Phenomena 105 (2005) 447
-
(2005)
Solid State Phenomena
, vol.105
, pp. 447
-
-
Mahieu, S.1
Ghekiere, P.2
De Winter, G.3
De Gryse, R.4
Depla, D.5
Van Tendeloo, G.6
-
37
-
-
18744364749
-
-
Shin C.S., Gall D., Kim Y.W., Helgren N., Petrov I., and Greene J.E. J Appl Phys 92 9 (2002) 5084
-
(2002)
J Appl Phys
, vol.92
, Issue.9
, pp. 5084
-
-
Shin, C.S.1
Gall, D.2
Kim, Y.W.3
Helgren, N.4
Petrov, I.5
Greene, J.E.6
-
38
-
-
0038650933
-
-
Gall D., Kodambaka S., Wall M.A., Petrov I., and Greene J.E. J Appl Phys 93 11 (2003) 9086
-
(2003)
J Appl Phys
, vol.93
, Issue.11
, pp. 9086
-
-
Gall, D.1
Kodambaka, S.2
Wall, M.A.3
Petrov, I.4
Greene, J.E.5
-
39
-
-
36449001627
-
-
Hultman L., Sundgren J.-E., Greene J.E., Bergstrom D.B., and Petrov I. J Appl Phys 78 (1995) 5395
-
(1995)
J Appl Phys
, vol.78
, pp. 5395
-
-
Hultman, L.1
Sundgren, J.-E.2
Greene, J.E.3
Bergstrom, D.B.4
Petrov, I.5
-
45
-
-
33846790637
-
-
Umanskyi YaS, Skakov YuA, Ivanov AN, Rastorguev LN, Kristallografiya, Rentgenografiya i Elektronnaya Microscopiya, Moscow, Metallurgiya, 1982 [in Russian].
-
-
-
-
46
-
-
33846838238
-
-
JCPDS 1997-International Centre for Diffraction Data, file No. 38-1420.
-
-
-
|