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Volumn 299, Issue 1, 2007, Pages 48-58

Investigation of oxygen distribution in electromagnetic CZ-Si melts with a transverse magnetic field using 3D global modeling

Author keywords

A1. Computer simulation; A1. Impurities; A1. Magnetic fields; A2. Magnetic field assisted Czochralski method; B2. Semiconducting silicon

Indexed keywords

CRYSTAL GROWTH; ELECTRIC CURRENTS; ELECTROMAGNETIC FIELDS; MAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS; NUMERICAL METHODS; THREE DIMENSIONAL COMPUTER GRAPHICS;

EID: 33846580617     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.10.247     Document Type: Article
Times cited : (45)

References (25)
  • 25
    • 33846641110 scopus 로고    scopus 로고
    • K. Hoshikawa, H. Hirata, H. Nakanishi, K. Ikuta, in: H.R. Huff, R.J. Kriegler, Y. Takeishi (Eds.), Semiconductor Silicon, The Electrochemical Society, Pennington, 1981, p. 101.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.