A mechanism for cutting carbon nanotubes with a scanning tunneling microscope

European Physical Journal B

Volumn 17, Issue 2, 2000, Pages 301-308

  Rubio, A ^a,b,c   Apell, S P ^b,c,d   Venema, L C ^e   Dekker, C ^e  

^a UNIVERSITY OF VALLADOLID   (Spain)

^b UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^c DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^d CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^e DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

61.16.Ch Scanning probe microscopy: Scanning tunneling, atomic force, scanning optical, magnetic force, etc.; 61.48.+c Fullerenes and fullerene related materials; 62.20.Fe Deformation and plasticity (including yield, ductility, and superplasticity)

Indexed keywords

EID: 0041703506     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510070145     Document Type: Article

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48. 0/d (per unit area) we then get the final result for the force given in equation (2).
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51. It is known from other works (H.F. Budd, J. Vannimenus, Phys. Rev. Lett. 31, 1218 (1973); Phys. Rev. B 12, 509 (1975); S. Andersson, B.N.J. Persson, M. Persson, N.D. Lang, Phys. Rev. Lett. 52, 2073 (1984)) that the classical force used by invoking equation (2) actually reflects an average over the true force acting. There is also a first order response which we should consider since our system is truly microscopic. Within linear response the total force F acting on the ions from an external field E has to average to zero. We checked that this linear term contribution is very small in our particular case.
52. It is known from other works (H.F. Budd, J. Vannimenus, Phys. Rev. Lett. 31, 1218 (1973); Phys. Rev. B 12, 509 (1975); S. Andersson, B.N.J. Persson, M. Persson, N.D. Lang, Phys. Rev. Lett. 52, 2073 (1984)) that the classical force used by invoking equation (2) actually reflects an average over the true force acting. There is also a first order response which we should consider since our system is truly microscopic. Within linear response the total force F acting on the ions from an external field E has to average to zero. We checked that this linear term contribution is very small in our particular case.
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57. Higher resolution and photon intensities can be achieved by taking advantage of the optical-field enhancement at the STM-tip when the tip-surface cavity is illuminated on with a laser. The field enhancement factor is of the order of 1 000 for typical STM-tips and substrates as highly oriented pyrolytic graphite or gold (A.V. Bragas, S.M. Landi, O.E. Martínez, Appl. Phys. Lett. 72, 2075 (1998)). This new optical microscopy can also be used to study the linear and nonlinear optical response of carbon nanotubes and other nanostructures.