An automatic parameter extraction technique for advanced CMOS device modeling using genetic algorithm

Microelectronic Engineering

Volumn 84, Issue 2, 2007, Pages 260-272

  Li, Yiming ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

CMOS devices; Compact model; Computational intelligence; Computer aided design; Extraction methodology; Genetic algorithm; Parameter quality

Indexed keywords

ARTIFICIAL INTELLIGENCE; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; COMPUTER AIDED DESIGN; GENETIC ALGORITHMS; MOSFET DEVICES; SEMICONDUCTOR DEVICES;

CMOS DEVICES; COMPACT MODELS; EXTRACTION METHODOLOGY; PARAMETER QUALITY;

FEATURE EXTRACTION;

EID: 33846199235     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.02.010     Document Type: Article

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