Study on effects of tip geometry on AFM nanoscratching tests

Wear

Volumn 262, Issue 3-4, 2007, Pages 477-483

  Yan, Y D ^a   Sun, T ^a   Dong, S ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

AFM; Copper; Diamond tip; Nanoscatching; Silicon

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; DIAMOND CUTTING TOOLS; FRICTION; SILICON; WEAR OF MATERIALS; WEAR RESISTANCE;

CANTILEVER DEFLECTION; DIAMOND TIP; NANOSCRATCHING; TIP GEOMETRY;

CRYSTALLINE MATERIALS;

ATOMIC FORCE MICROSCOPY; COPPER; CRYSTALLINE MATERIALS; DIAMOND CUTTING TOOLS; FRICTION; SILICON; WEAR OF MATERIALS; WEAR RESISTANCE;

EID: 33846080707     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2006.06.017     Document Type: Article

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