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Volumn 148, Issue 1, 2006, Pages 133-165

Optimization problems in electron microscopy of single particles

Author keywords

Electron microscopy; Optimization; Single particles

Indexed keywords


EID: 33845288376     PISSN: 02545330     EISSN: 15729338     Source Type: Journal    
DOI: 10.1007/s10479-006-0078-8     Document Type: Article
Times cited : (11)

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