Improved Bayesian image denoising based on wavelets with applications to electron microscopy

Pattern Recognition

Volumn 39, Issue 6, 2006, Pages 1205-1213

  Sorzano, C O S ^a,b   Ortiz, E ^a   Lopez M ^c,e   Rodrigo, J ^d  

^a UNIVERSIDAD SAN PABLO CEU   (Spain)

^b CENTRO NACIONAL DE BIOTECNOLOGÍA   (Spain)

^c Escuela Tecnica Superior de Ingenieros de Caminos Canales y Puertos   (Spain)

^d UNIVERSIDAD PONTIFICIA COMILLAS   (Spain)

^e UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

Bayesian filtering; Image denoising; Wavelets

Indexed keywords

BAYESIAN FILTERING; DENOISING ALGORITHM; IMAGE DENOISING;

ALGORITHMS; ELECTRON MICROSCOPY; OPTIMIZATION; PARAMETER ESTIMATION; WAVELET TRANSFORMS;

IMAGE PROCESSING;

EID: 33644970463     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2005.12.009     Document Type: Article

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