Spline-based image-to-volume registration for three-dimensional electron microscopy

Ultramicroscopy

Volumn 103, Issue 4, 2005, Pages 303-317

  Jonic S ^a,e   Sorzano, C O S ^a,b   Thevenaz P ^a   El Bez, C ^c   De Carlo, S ^d   Unser, M ^a  

^a EPFL   (Switzerland)

^b UNIVERSIDAD SAN PABLO CEU   (Spain)

^c UNIVERSITY OF LAUSANNE   (Switzerland)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

2D 3D registration; 3DEM; Angular assignment; CST; Splines

Indexed keywords

ALGORITHMS; ELEMENTARY PARTICLES; FOURIER TRANSFORMS; FUNCTIONS; IMAGE RECONSTRUCTION; PARAMETER ESTIMATION; THEOREM PROVING;

CENTRAL-SLICE THEOREM (CST); COST FUNCTIONS; PROJECTION; THREE-DIMENSIONAL ELECTRON MICROSCOPY (3DEM);

ELECTRON MICROSCOPY;

ACCURACY; ALGORITHM; ARTICLE; DATA ANALYSIS; ELECTRON MICROSCOPY; FOURIER TRANSFORMATION; IMAGE ANALYSIS; MATHEMATICAL MODEL; PARAMETER; REGRESSION ANALYSIS; THREE DIMENSIONAL IMAGING;

ALGORITHMS; BACTERIORHODOPSINS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; MODELS, MOLECULAR;

EID: 18844424991     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.02.002     Document Type: Article

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