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Volumn 122, Issue 3, 1998, Pages 328-339

A maximum-likelihood approach to single-particle image refinement

Author keywords

Electron microscopy; Maximum likelihood; Single particle alignment

Indexed keywords

ARTICLE; ELECTRON MICROSCOPY; IMAGE RECONSTRUCTION; INTERMETHOD COMPARISON; MAXIMUM LIKELIHOOD METHOD; PRIORITY JOURNAL; SIGNAL NOISE RATIO; SIMULATION;

EID: 0031704540     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1006/jsbi.1998.4014     Document Type: Article
Times cited : (247)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.