Maximum-likelihood multi-reference refinement for electron microscopy images

Journal of Molecular Biology

Volumn 348, Issue 1, 2005, Pages 139-149

  Scheres, Sjors H W ^a   Valle, Mikel ^a   Nuñez, Rafael ^a   Sorzano, Carlos O S ^a,b   Marabini, Roberto ^c   Herman, Gabor T ^d   Carazo, Jose Maria ^a,c  

^a CENTRO NACIONAL DE BIOTECNOLOGÍA   (Spain)

^b UNIVERSIDAD SAN PABLO CEU   (Spain)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^d CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

2D alignment; Classification; Maximum likelihood; Multi reference refinement; Single particles

Indexed keywords

DOUBLE STRANDED DNA; VIRUS T ANTIGEN;

ARTICLE; CORRELATION ANALYSIS; DNA PROBE; ELECTRON MICROSCOPY; MATHEMATICAL MODEL; MICROSCOPE; PRIORITY JOURNAL; SIGNAL NOISE RATIO; SIMIAN VIRUS 40; SIMULATION; STAINING; VIRUS REPLICATION;

EID: 16244396466     PISSN: 00222836     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmb.2005.02.031     Document Type: Article

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