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Volumn 2006, Issue , 2006, Pages 228-233

RF front-end system gain and linearity built-in test

Author keywords

Built in test; CMOS RF amplitude detector; Gfain measurement; Linearity measurement; RF test

Indexed keywords

CMOS INTEGRATED CIRCUITS; MEASUREMENT THEORY; SYSTEMS ANALYSIS;

EID: 33751100947     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.59     Document Type: Conference Paper
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.