Feature extraction based built-in alternate test of RF components using a noise reference

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 273-278

  Akbay, Selim Sermet ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN OF TESTABILITY (DOF); RADIO FREQUENCY; SYSTEM-ON-CHIP (SOC);

BANDWIDTH; COMPUTER HARDWARE; COMPUTER SIMULATION; MATHEMATICAL MODELS; PROBLEM SOLVING; SPECTRUM ANALYSIS; STANDARDS; TELECOMMUNICATION SYSTEMS;

SPURIOUS SIGNAL NOISE;

EID: 3142733715     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299254     Document Type: Conference Paper

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