GHz RF front-end bandwidth time domain measurement

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 223-228

  Wang, Qi ^a   Tang, Yi ^a   Soma, Mani ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; FAST FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; JITTER; SPECTRUM ANALYZERS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS; TRANSFER FUNCTIONS;

CIRCUIT UNDER TEST (CUT); EMBEDDED TIMING ANALYSIS (ETA); FRONT-END CIRCUITS; ON-CHIP TEST CIRCUIT;

INTEGRATED CIRCUITS;

EID: 3142742529     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.optcom.2003.10.052     Document Type: Conference Paper

References (11)

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