IIP3 estimation from the gain compression curve

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 4 I, 2005, Pages 1197-1202

  Cho, Choongeol ^a   Eisenstadt, William R ^a   Stengel, Bob ^b   Ferrer, Enrique ^b  

^a University of Florida   (United States)

^b MOTOROLA INC   (United States)

Author keywords

1 dB gain compression point; Amplifier nonlinear characteristics; Input referred third order intercept point (IIP3) estimation; Integrated circuit (IC) test; Third order intercept point (IP3)

Indexed keywords

COMPUTER SIMULATION; ESTIMATION; FREQUENCIES; GAIN CONTROL; INTEGRATED CIRCUIT TESTING; TRANSISTORS;

1-DB COMPRESSION POINT; AMPLIFIER NONLINEAR CHARACTERISTICS; INPUT-REFERRED THIRD-ORDER INTERCEPT POINT (IIP3); INTEGRATED CIRCUIT (IC) TEST; THIRD-ORDER INTERCEPT POINT (IP3);

AMPLIFIERS (ELECTRONIC);

EID: 18744374955     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.845746     Document Type: Article

References (9)

1. S. Choi, W. R. Eisenstadt, and R. Fox, "Design of programmable embedded IF source for design self-test," in Proc. Int. Circuits Systems Symp., 2003, pp. V-241-V-244.
2. M. M. Hafed and G. W. Roberts, "Techniques for high-frequency integrated test and measurements,"IEEE Trans. Instrum. Meas., vol. 52, no. 6, pp. 1780-1786, Dec. 2003.
3. A. Halder, S. Bhattacharya, and A. Chatterjee, "Automatic multitone alternate test generation for RF circuits using behavioral models," in Proc. Int. Test Conf., 2003, pp. 665-673.
4. B. Razabi, RF Microelectronics. Englewood Cliffs, NJ: Prentice-Hall, 1998.
5. G. Gonzalez, Microwave Transistors Amplifiers, 2nd ed. Englewood Cliffs, NJ: Prentice-Hall, 1997.
6. W. R. Eisenstadt, C. Cho, R. Stengel, and E. Ferrer, "Third-order intercept point (IIP3) from gain compression curve," presented at the 2nd Test of Wireless Circuits and Systems Workshop, Baltimore, MD, Oct. 10-11, 2002.
7. S. A. Maars, Nonlinear Microwave Circuits. Norwood, MA: Artech House, 1988.
8. C. Fager et al., "Prediction of IMD in LDMOS transistor amplifiers using a new large-signal model,"IEEE Trans. Microw. Theory Tech., no. 12, pp. 2834-2842, Dec. 2002.
9. P. Wambacq and W. Sansen, Distortion Analysis of Analog Integrated Circuits. Boston, MA: Kluwer, 1998.