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4
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84893746200
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A signature test framework for rapid production testing of rf circuits
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Paris, 4-8 March 2002
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Voorakaranam, R.; Cherubal, S.; Chatterjee, A . : ?A Signature Test Framework for Rapid Production Testing of RF Circuits.? Proc. of the Design, Automation and Test in Europe Conference (DATE 2002), Paris, 4-8 March 2002, pp. 186-191.
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Voorakaranam, R.1
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5
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0032634314
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Measurement of noise figure, git, and ei/no using rssi
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17-18 June
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Lee, Ch-Y.; Panton, W.; Granata, G.; Rajkotia, A.: ?Measurement of Noise Figure, GIT, and Ei/No using RSSI.? Proc. of the IEEE MTT-S Symposium on Technologies for Wireless Applications, Analleim, CA, 17-18 June 1999, pp. 101-103.
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Lee, C.-Y.1
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6
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77956031432
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System level testing of analog functions in a mixed-signal circuit
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Beirut, Libanon, 17-20 Dec 2000
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AI-Qutayri, M.A.: ?System Level Testing of Analog Functions in a Mixed-Signal Circuit.? 7th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2000). Beirut, Libanon, 17-20 Dec 2000, Vol. 2, pp. 1026-1029.
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Ai-Qutayri, M.A.1
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7
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0034482667
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A StandAlone Integrated Test Core for Time and Frequency Domain Measurements
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Atlantic City, NJ. 3-5 Oct 2000
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Hafed, M.; Abaskharoun, N.; Roberts, GW.: ?A StandAlone Integrated Test Core for Time and Frequency Domain Measurements.? Proc. of the International Test Conference ( ITC 2000). Atlantic City, NJ. 3-5 Oct 2000, pp. 1031-1040.
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Hafed, M.1
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0033719719
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A stand-Alone integrated excitationlextraction system for analog bist applications
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Orlando, FL, 21-24 May 2000
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Hafed, M. M.; Roberts, GW.: ?A Stand-Alone Integrated ExcitationlExtraction System for Analog BIST Applications.? Proc. of the 2000 IEEE Custom Integrated Circuits Conference (CrCC'2000), Orlando, FL, 21-24 May 2000, pp. 83-86.
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Hafed, M.M.1
Roberts, G.W.2
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9
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84962385221
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A new loopback gsmidcs bit error rate test method on brfas eband i1q outputs
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Phoenix, AZ, 25 May
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Nowakowski, J-F.; Bonhoure, B.; Carbonero, lL.: ?A New Loopback GSMIDCS Bit Error Rate Test Method On BRFas eband I1Q Outputs.? Proc. of the IEEE 57th Automatic Techniques Group (ARFTG 57), Phoenix, AZ, 25 May 2001, pp. 113-117.
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Nowakowski, J.-F.1
Bonhoure, B.2
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11
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84893701395
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A bist scheme for on-chip adc and dac testing
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Paris, 27-30 March 2000
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[1 1 ] Huang, l-L.; Ong, C-K.; Cheng, K-T.: ?A BIST Scheme for On-Chip ADC and DAC Testing.? Proc. of the Design, Automation and Test in Europe Conference (DATE 2000), Paris, 27-30 March 2000, pp. 216-220.
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Huang, L.-L.1
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