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Volumn , Issue , 2003, Pages 478-483

RF-BIST: Loopback spectral signature analysis

Author keywords

[No Author keywords available]

Indexed keywords

BUILTIN SELF-TEST (BIST); COMPLEX STRUCTURE; RF-BIST; SPECTRAL SIGNATURE; SYSTEM LEVELS;

EID: 84893749534     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253655     Document Type: Conference Paper
Times cited : (63)

References (11)
  • 7
    • 0034482667 scopus 로고    scopus 로고
    • A StandAlone Integrated Test Core for Time and Frequency Domain Measurements
    • Atlantic City, NJ. 3-5 Oct 2000
    • Hafed, M.; Abaskharoun, N.; Roberts, GW.: ?A StandAlone Integrated Test Core for Time and Frequency Domain Measurements.? Proc. of the International Test Conference ( ITC 2000). Atlantic City, NJ. 3-5 Oct 2000, pp. 1031-1040.
    • (2000) Proc. of the International Test Conference ( ITC , pp. 1031-1040
    • Hafed, M.1    Abaskharoun, N.2    Roberts, G.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.