RF testing on a mixed signal tester

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 793-800

  Brown, Dana ^a   Ferrario, John ^a   Wolf, Randy ^a   Li, Jing ^a   Bhagat, Jayendra ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; COMPUTATIONAL COMPLEXITY; DIGITAL LIBRARIES; FAST FOURIER TRANSFORMS; GAIN CONTROL; GLOBAL POSITIONING SYSTEM; INTEGRATED CIRCUITS; INTERFACES (COMPUTER); SIGNAL PROCESSING; STATISTICAL MECHANICS;

AUTOMATIC GAIN CONTROL (AGC); LOW NOISE AMPLIFIERS (LNA); SIGNAL TESTING; VARIABLE GAIN AMPLIFIERS (VGA);

DESIGN FOR TESTABILITY;

EID: 18144387301     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. International Technology Roadmap for Semiconductors: Executive Summary, ITRS, 2003
2. Deshaves, "Cost of Test Reduction", Proceedings International Test Conference, Washington D.C., Oct. 1998.
3. M. Soma, "Challenges and approaches in mixed signal RF testing", 10th Annual IEEE International ASIC conference, Portland, Oregon, Sept. 1997.
4. M. Awad, and J. Li,"Reducing RF Parameter Tests for Cost Reduction: Device Modeling, Hypothesis Testing and Experiment Verification", the 53rd Electronic Components and Technology Conference, May 2003.
5. J. Ferrario, R. Wolf and S. Moss, "Architecting Millisecond Test Solutions for Wireless Phone RFIC's", Proceedings International Test Conference, Washington D.C., Oct. 2002.
6. J. Bhagat, J. Ferrario, R. Wolf, and M. Slamani, "Challenges of incorporating an RF test system on a board", 3rd workshop on test of wireless circuits and systems, 2004
7. Behzad Razavi, "RF Microelectronics", Prentice Hall, 1998
8. D. M. Pozar, "Microwave Engineering", John&Wiley, 2004.
9. Fundamentals of RF and Microwave: Noise Figure Measurement, Application Note 57-1, Hewlett Packard, 1983.