Wafer-level RF test and DfT for VCO modulating transceiver architecures

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 217-222

  Ozev, Sule ^a   Olgaard, Christian ^b  

^a DUKE UNIVERSITY   (United States)

^b LitePoint Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE NOISE; RADIO FREQUENCY (RF) PATH; VARIABLE GAIN AMPLIFIERS (VGA); WAFER-LEVEL TESTING;

BIT ERROR RATE; COMPUTER SIMULATION; COSTS; DESIGN FOR TESTABILITY; ELECTRONICS PACKAGING; FREQUENCY SHIFT KEYING; MODULATION; VARIABLE FREQUENCY OSCILLATORS;

TRANSCEIVERS;

EID: 3142748450     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299246     Document Type: Conference Paper

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