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Volumn 201, Issue 6, 2006, Pages 3368-3376

Thermal stability of magnetron sputtered Zr-Si-N films

Author keywords

Crystallization; High Si3N4 content; Magnetron sputtering; Thermal stability; Zr Si N films

Indexed keywords

AMORPHOUS FILMS; ANNEALING; CERAMIC MATERIALS; CRYSTALLIZATION; INTERDIFFUSION (SOLIDS); PHASE COMPOSITION; THERMODYNAMIC STABILITY;

EID: 33750973045     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.07.206     Document Type: Article
Times cited : (47)

References (35)
  • 34
    • 33750986549 scopus 로고    scopus 로고
    • P. Zeman, J. Musil, Appl. Surf. Sci. (in press).
  • 35
    • 0005976716 scopus 로고
    • Block S., and Hubbard C.R. (Eds), National Bureau of Standards, Washington
    • Langford J.I. In: Block S., and Hubbard C.R. (Eds). Accuracy in Powder Diffraction. NBS Special Publication vol. 567 (1980), National Bureau of Standards, Washington 255
    • (1980) NBS Special Publication , vol.567 , pp. 255
    • Langford, J.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.