SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 38, Issue 11, 2006, Pages 1386-1392

Advances in time-of-flight secondary ion mass spectrometry analysis of protein films

(2) Michel, Roger a Castner, David G a

a UNIVERSITY OF WASHINGTON (United States)

Author keywords

Advances; Classification; Conformation; Protein; SIMS; Surface

Indexed keywords

CONFORMATIONS; MOLECULAR STRUCTURE; PROTEINS; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY;

BIOLOGICAL SAMPLES; CLASSIFICATION; CLUSTER ION SOURCES; SPECTRAL QUALITY;

BIOFILMS;

EID: 33750908065 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.2382 Document Type: Review

Times cited : (69)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.