ToF-SIMS quantification of albumin adsorbed on plasma-deposited fluoropolymers by partial least-squares regression

Surface and Interface Analysis

Volumn 29, Issue 12, 2000, Pages 837-844

  Ferrari, Sandro ^a   Ratner, Buddy D ^b  

^a LABORATORIO MDM   (Italy)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; DEPOSITION; FLUORINE CONTAINING POLYMERS; GLOW DISCHARGES; LEAST SQUARES APPROXIMATIONS; NITROGEN; REGRESSION ANALYSIS; SECONDARY ION MASS SPECTROMETRY; SENSITIVITY ANALYSIS; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE SENSITIVITY;

PROTEINS;

EID: 0034506829     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200012)29:12<837::AID-SIA937>3.0.CO;2-O     Document Type: Article

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