Analysis of Poly(amino acids) by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Surface Science Spectra

Volumn 8, Issue 3, 2001, Pages 163-184

  Samuel, Newton T ^a   Wagner, M S ^a   Dornfeld, K D ^a   Castner, David G ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMINO ACIDS; MICA; SECONDARY EMISSION;

ACID SOLVENTS; MICA SUBSTRATES; POLY(AMINO ACIDS); PROTEIN FILMS; SILICON SUBSTRATES; SOLVENT CAST; SPECTRA'S; SPIN CAST; STATIC TIME; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

EID: 1542319826     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20020301     Document Type: Article

References (2)

1. M. S.Wagner and D. G.Castner, Langmuir 17, 4649 (2001). 10.1021/la001209t
2. D. S.Mantus, B.D.Ratner, B. A.Carlson, and J. F.Moulder, Anal. Chem. 65, 1431 (1993). 10.1021/ac00058a021