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Volumn 20, Issue 5, 2004, Pages 1877-1887

Probing the orientation of surface-immobilized immunoglobulin G by time-of-flight secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ANTIGENS; ATOMIC FORCE MICROSCOPY; COMPOSITION; IMMUNOLOGY; MOLECULAR ORIENTATION; PRINCIPAL COMPONENT ANALYSIS; SECONDARY ION MASS SPECTROMETRY; SURFACE PROPERTIES;

EID: 1542345315     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la035376f     Document Type: Article
Times cited : (158)

References (37)
  • 5
    • 1542289672 scopus 로고
    • Etude de poly(oxides aminés) par ToF SIMS et XPS. Application à l'analyse d'une protéine
    • Undergraduate Thesis,l Catholic University of Louvain (Faculté des Sciences Agronomiques, Unité de Chimie des interfaces), Belgium
    • Bartiau, S. Etude de poly(oxides aminés) par ToF SIMS et XPS. Application à l'analyse d'une protéine. Undergraduate Thesis,l Catholic University of Louvain (Faculté des Sciences Agronomiques, Unité de Chimie des interfaces), Belgium, 1995.
    • (1995)
    • Bartiau, S.1
  • 34
    • 78649590691 scopus 로고    scopus 로고
    • Multivariate analysis of TOF-SIMS spectra from self-assembled monolayers
    • Ph.D. Thesis, University of Washington
    • Graham, D. J. Multivariate analysis of TOF-SIMS spectra from self-assembled monolayers. Ph.D. Thesis, University of Washington, 2001.
    • (2001)
    • Graham, D.J.1
  • 37
    • 1542319798 scopus 로고    scopus 로고
    • www.pdb.org.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.