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Volumn 89, Issue 17, 2006, Pages

Anisotropic field-effect mobility of pentacene thin-film transistor: Effect of rubbed self-assembled monolayer

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; DEPOSITION; MORPHOLOGY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33750486803     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2364125     Document Type: Article
Times cited : (54)

References (18)
  • 4
    • 0347053867 scopus 로고    scopus 로고
    • Y. Y. Lin, D. J. Gundlach, S. F. Nelson, and T. N. Jackson, IEEE Electron Device Lett. 0741-3106 10.1109/55.644085 18, 606 (1997); J. H. Schon, C. Kloc, and B. Batlog, Org. Electron. 1, 57 (2000).
    • (2000) Org. Electron. , vol.1 , pp. 57
    • Schon, J.H.1    Kloc, C.2    Batlog, B.3
  • 6
    • 0142088983 scopus 로고    scopus 로고
    • 0003-6951 10.1063/1.1613997
    • J. Lee, J. H. Kim, and S. Im, Appl. Phys. Lett. 0003-6951 10.1063/1.1613997 83, 2689 (2003); S. J. Kang, K. B. Chung, D. S. Park, H. J. Kim, Y. K. Choi, M. H. Jang, M. Noh, and C. N. Whang, Synth. Met. 146, 351 (2004).
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 2689
    • Lee, J.1    Kim, J.H.2    Im, S.3
  • 9
    • 0035691751 scopus 로고    scopus 로고
    • Y. Y. Lin, D. J. Gundlach, S. F. Nelson, and T. N. Jackson, IEEE Trans. Electron Devices 0018-9383 10.1109/16.605476 44, 1325 (1997); D. J. Gundlach, L. L. Jia, and T. N. Jackson, IEEE Electron Device Lett. 22, 571 (2001).
    • (2001) IEEE Electron Device Lett. , vol.22 , pp. 571
    • Gundlach, D.J.1    Jia, L.L.2    Jackson, T.N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.