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Volumn 50, Issue 9-10, 2006, Pages 1515-1521

Study on mobility enhancement in MOVPE-grown AlGaN/AlN/GaN HEMT structures using a thin AlN interfacial layer

Author keywords

AlGaN; AlN; GaN; HEMT; Mobility; MOVPE

Indexed keywords

ALUMINUM NITRIDE; CARRIER MOBILITY; ELECTRON TRANSPORT PROPERTIES; GALLIUM NITRIDE; METALLORGANIC VAPOR PHASE EPITAXY; THIN FILMS;

EID: 33750290286     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2006.07.016     Document Type: Article
Times cited : (27)

References (15)
  • 1
    • 0842288132 scopus 로고    scopus 로고
    • Joshin K, Kikkawa T, Hayashi H, Maniwa T, Yokokawa S, Yokoyama M et al. 2003 Tech. Digest in the IEEE international electron devices meeting (IEDM) 2003. p. 983-6.
  • 3
    • 17644445773 scopus 로고    scopus 로고
    • Ishida H, Hirose Y, Murata T, Kanda A, Ikeda Y, Matsuno T et al. 2003 Tech. Digest in the IEEE international electron devices meeting (IEDM) 2003. p. 583-6.
  • 4
    • 0842309763 scopus 로고    scopus 로고
    • Saito W, Takada Y, Kuraguchi M, Tsuda K, Ohmura I, Ogura T. 2003 Tech. Digest in the IEEE international electron devices meeting (IEDM) 2003. p. 587-90.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.