Hole-transport barrier and band bending at the indium tin oxide/polymer/ p-AlGaN interface

Applied Physics Letters

Volumn 89, Issue 15, 2006, Pages

  Lin, Yow Jon ^a  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC MODIFICATION; INDIUM TIN OXIDE; SURFACE BAND; THIN POLYMER FILMS;

BAND STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; INTERFACIAL ENERGY; OHMIC CONTACTS; PLASTIC FILMS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

HOLE MOBILITY;

EID: 33750004190     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2362597     Document Type: Article

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