Dependability analysis of nano-scale FinFET circuits

Proceedings - IEEE Computer Society Annual Symposium on Emerging VLSI Technologies and Architectures 2006

Volumn 2006, Issue , 2006, Pages 399-404

  Wang, Feng ^a   Xie, Yuan ^a   Bernstein, Kerry ^b   Luo, Yan ^c  

^a The Pennsylvania State University   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DESIGN; FINFET CIRCUITS; SOFT ERROR IMMUNITY;

CMOS INTEGRATED CIRCUITS; ERROR ANALYSIS; FIELD EFFECT TRANSISTORS; PRODUCT DESIGN;

NANOSTRUCTURED MATERIALS;

EID: 33749341857     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISVLSI.2006.35     Document Type: Conference Paper

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