Čerenkov losses: A limit for bandgap determination and Kramers-Kronig analysis

Micron

Volumn 37, Issue 5, 2006, Pages 396-402

  Stoger Pollach M ^a   Franco, H ^a   Schattschneider, P ^a   Lazar, S ^b   Schaffer, B ^c   Grogger, W ^c   Zandbergen, H W ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c Center for Electron Microscopy   (Austria)

Author keywords

68.37.Lp (TEM STEM HRTEM); 73.20. r (electr. states at surfaces and interfaces); 79.20.Uv (EELS)

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSITIONS; INSULATING MATERIALS; MONOCHROMATORS; PHOTONS; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

68.37.LP (TEM/STEM/HRTEM); 73.20.-R (ELECTR. STATES AT SURFACES AND INTERFACES; 79.20.UV (EELS); ENERGY FILTERS; SPATIAL RESOLUTION;

ENERGY GAP;

EID: 33744927194     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2006.01.001     Document Type: Article

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