Monochromized 200kv (S)TEM

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 70-71

  Tiemeijer, P C ^a   Van Lin, J H A ^a   Freitag, B H ^a   De Jong, A F ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036409165     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s143192760210184x     Document Type: Conference Paper

References (3)

1. M. Barfels et al., elsewhere in these proceedings.
2. P.C. Tiemeijer, Inst. Phys. Conf. Ser. 161(1999)191.
3. C. Mitterbauer et al., contribution to ICEM15 (2002).