-
1
-
-
0037011210
-
-
Carrol, R. L.; Gorman, C. B. Angew. Chem., Int. Ed. 2002, 41, 4378.
-
(2002)
Angew. Chem., Int. Ed.
, vol.41
, pp. 4378
-
-
Carrol, R.L.1
Gorman, C.B.2
-
3
-
-
0034735798
-
-
Joachim, C.; Gimzewski, J. K.; Aviram, A. Nature (London) 2000, 408, 541.
-
(2000)
Nature (London)
, vol.408
, pp. 541
-
-
Joachim, C.1
Gimzewski, J.K.2
Aviram, A.3
-
4
-
-
11144255097
-
-
Möbius, D., Miller, R., Eds; Elsevier: Amsterdam
-
Organized Monolayers and Assemblies: Structure, Processes, and Function; Möbius, D., Miller, R., Eds; Elsevier: Amsterdam, 2002.
-
(2002)
Organized Monolayers and Assemblies: Structure, Processes, and Function
-
-
-
9
-
-
0032021791
-
-
Sieval, A. B.; Demirel, A. L.; Nissink, J. W. M.; Linford, M. R.; van der Maas, J. H.; de Jeu, W. H.; Zuilhof, H.; Sudhölter, E. J. R. Langmuir 1998, 14, 1759.
-
(1998)
Langmuir
, vol.14
, pp. 1759
-
-
Sieval, A.B.1
Demirel, A.L.2
Nissink, J.W.M.3
Linford, M.R.4
Van Der Maas, J.H.5
De Jeu, W.H.6
Zuilhof, H.7
Sudhölter, E.J.R.8
-
10
-
-
14744269444
-
-
(a) Sun, Q.-Y.; de Smet, L. C. P. M.; van Lagen, B.; Giesbers, M.; Thüne, P. C.; van Engelenburg, J.; de Wolf, F. A.; Zuihof, H.; Sudhöelter, E. J. R. J. Am. Chem. Soc. 2005, 127, 2514.
-
(2005)
J. Am. Chem. Soc.
, vol.127
, pp. 2514
-
-
Sun, Q.-Y.1
De Smet, L.C.P.M.2
Van Lagen, B.3
Giesbers, M.4
Thüne, P.C.5
Van Engelenburg, J.6
De Wolf, F.A.7
Zuihof, H.8
Sudhöelter, E.J.R.9
-
11
-
-
3242685571
-
-
(b) Sun, Q.-Y.; de Smet, L. C. P. M.; van Lagen, B.; Wright, A.; Zuihof, H.; Sudhöelter, E. J. R. Angew. Chem., Int. Ed. 2004, 43, 1352.
-
(2004)
Angew. Chem., Int. Ed.
, vol.43
, pp. 1352
-
-
Sun, Q.-Y.1
De Smet, L.C.P.M.2
Van Lagen, B.3
Wright, A.4
Zuihof, H.5
Sudhöelter, E.J.R.6
-
12
-
-
25844477144
-
-
(a) Chen, B.; Flatt, A. K.; Jian, H.; Hudson, J. L.; Tour, J. M. Chem. Mater. 2005, 17, 4832.
-
(2005)
Chem. Mater.
, vol.17
, pp. 4832
-
-
Chen, B.1
Flatt, A.K.2
Jian, H.3
Hudson, J.L.4
Tour, J.M.5
-
13
-
-
0346499204
-
-
(b) Stewart, M. P.; Maya, F.; Kosynkin, D. V.; Dirk, S. M.: Stapleton, J. J.; McGuiness, C. L.; Allara, D. L.; Tour, J. M. J. Am. Chem. Soc. 2004, 126, 370.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 370
-
-
Stewart, M.P.1
Maya, F.2
Kosynkin, D.V.3
Dirk, S.M.4
Stapleton, J.J.5
McGuiness, C.L.6
Allara, D.L.7
Tour, J.M.8
-
14
-
-
0035955174
-
-
Tao, F.; Sim, W. S.; Xu, G. Q.; Qiao, M. H. J. Am. Chem. Soc. 2001, 123, 9397.
-
(2001)
J. Am. Chem. Soc.
, vol.123
, pp. 9397
-
-
Tao, F.1
Sim, W.S.2
Xu, G.Q.3
Qiao, M.H.4
-
15
-
-
17444395977
-
-
(a) Huang, H. G.; Cai, Y. H.; Huang, J. Y.; Tang, H. H.; Xu, G. Q. Langmuir 2005, 21, 3384.
-
(2005)
Langmuir
, vol.21
, pp. 3384
-
-
Huang, H.G.1
Cai, Y.H.2
Huang, J.Y.3
Tang, H.H.4
Xu, G.Q.5
-
16
-
-
1242265232
-
-
(b) Zhang, Y. P.; Yang, L.; Lai, Y. H.; Xu, G. Q.; Wang, X. S. Appl. Phys. Lett. 2004, 84, 401.
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 401
-
-
Zhang, Y.P.1
Yang, L.2
Lai, Y.H.3
Xu, G.Q.4
Wang, X.S.5
-
17
-
-
1542313974
-
-
Mayne, A. J.; Lastapis, M.; Baffou, G.; Soukiassian, L.; Comtet, G.; Hellner, L.; Dujardin, G. Phys. Rev. B 2004, 69, 45409.
-
(2004)
Phys. Rev. B
, vol.69
, pp. 45409
-
-
Mayne, A.J.1
Lastapis, M.2
Baffou, G.3
Soukiassian, L.4
Comtet, G.5
Hellner, L.6
Dujardin, G.7
-
18
-
-
4544325608
-
-
(a) Condorelli, G. G.; Motta, A.; Fragalà, I. L.; Giannazzo, F.; Ranieri, V.; Caneschi, A.; Gatteschi, D. Angew. Chem., Int. Ed. 2004, 43, 4081.
-
(2004)
Angew. Chem., Int. Ed.
, vol.43
, pp. 4081
-
-
Condorelli, G.G.1
Motta, A.2
Fragalà, I.L.3
Giannazzo, F.4
Ranieri, V.5
Caneschi, A.6
Gatteschi, D.7
-
19
-
-
20944438627
-
-
(b) Fleury, B.; Catala, L.; Hue, V.; David, C.; Zhong, W. Z.; Jegou, P.; Baraton, L.; Palacin, S.; Albouy, P.-A. Mallah, T. Chem. Commun. 2005, 2020.
-
(2005)
Chem. Commun.
, pp. 2020
-
-
Fleury, B.1
Catala, L.2
Hue, V.3
David, C.4
Zhong, W.Z.5
Jegou, P.6
Baraton, L.7
Palacin, S.8
Albouy, P.-A.9
Mallah, T.10
-
20
-
-
32144448658
-
-
(a) Thamyongkit, P.; Yu, L.; Padmaja, K.; Jiao, J.; Bocian, D. F.; Lindsey, J. S. J. Org. Chem. 2006, 71, 1156.
-
(2006)
J. Org. Chem.
, vol.71
, pp. 1156
-
-
Thamyongkit, P.1
Yu, L.2
Padmaja, K.3
Jiao, J.4
Bocian, D.F.5
Lindsey, J.S.6
-
21
-
-
33645774327
-
-
(b) Schmidt, I.; Jiao, J.; Thamyongkit, P.; Sharada, D. S.; Bocian, D. F.; Lindsey, J. S. J. Org. Chem. 2006, 71, 3033.
-
(2006)
J. Org. Chem.
, vol.71
, pp. 3033
-
-
Schmidt, I.1
Jiao, J.2
Thamyongkit, P.3
Sharada, D.S.4
Bocian, D.F.5
Lindsey, J.S.6
-
22
-
-
17044383004
-
-
Wei, L.; Syomin, D.; Loewe, R. S.; Lindsey, J. S.; Zaera, F.; Bocian, D. F. J. Phys. Chem. B 2005, 109, 6323.
-
(2005)
J. Phys. Chem. B
, vol.109
, pp. 6323
-
-
Wei, L.1
Syomin, D.2
Loewe, R.S.3
Lindsey, J.S.4
Zaera, F.5
Bocian, D.F.6
-
23
-
-
4644239964
-
-
Carcel, C, M.; Laha, J. K.; Loewe R. S.; Thamyongkit, P.; Schweikart, K.-H.; Misra, V.; Bocian, D. F.; Lindsey, J. S. J. Org. Chem. 2004, 69,6739.
-
(2004)
J. Org. Chem.
, vol.69
, pp. 6739
-
-
Carcel, C.M.1
Laha, J.K.2
Loewe, R.S.3
Thamyongkit, P.4
Schweikart, K.-H.5
Misra, V.6
Bocian, D.F.7
Lindsey, J.S.8
-
24
-
-
4043053537
-
-
(e) Liu, Z.; Yasseri, A. A.; Loewe, R. S.; Lysenko, A. B.; Malinovskii, V.L.;Zhao, Q.; Surthi, S.;Li.Q.;Misra, V.;Lindsey, J. S.; Bocian, D. F. J. Org. Chem. 2004, 69, 5568.
-
(2004)
J. Org. Chem.
, vol.69
, pp. 5568
-
-
Liu, Z.1
Yasseri, A.A.2
Loewe, R.S.3
Lysenko, A.B.4
Malinovskii, V.L.5
Zhao, Q.6
Surthi, S.7
Li, Q.8
Misra, V.9
Lindsey, J.S.10
Bocian, D.F.11
-
25
-
-
10744231117
-
-
(f) Balakumar, A.; Lysenko, A. B.; Carcel, C.; Malinovskii, V. L.; Gryko, D. T.; Schweikart, K.-H.; Loewe, R. S.; Yasseri, A. A.; Liu, Z.; Bocian, D. F.; Lindsey, J. S. J. Org. Chem. 2004, 69, 1435.
-
(2004)
J. Org. Chem.
, vol.69
, pp. 1435
-
-
Balakumar, A.1
Lysenko, A.B.2
Carcel, C.3
Malinovskii, V.L.4
Gryko, D.T.5
Schweikart, K.-H.6
Loewe, R.S.7
Yasseri, A.A.8
Liu, Z.9
Bocian, D.F.10
Lindsey, J.S.11
-
26
-
-
9644268734
-
-
(g) Yasseri, A. A.; Syomin, D.; Loewe, R. S.; Lindsey, J. S.; Zaera, F.; Bocian, D. F. J. Am. Chem. Soc. 2004, 126, 15603.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 15603
-
-
Yasseri, A.A.1
Syomin, D.2
Loewe, R.S.3
Lindsey, J.S.4
Zaera, F.5
Bocian, D.F.6
-
27
-
-
33646233447
-
-
(a) Decker, F.; Cattaruzza, F.; Coluzza, C.; Flamini, A.; Marrani, A. G.; Zanoni, R.; Dalchiele, E. A. J. Phys. Chem. B 2006, 110, 7374.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 7374
-
-
Decker, F.1
Cattaruzza, F.2
Coluzza, C.3
Flamini, A.4
Marrani, A.G.5
Zanoni, R.6
Dalchiele, E.A.7
-
28
-
-
12344293548
-
-
(b) Zanoni, R.; Cattaruzza, F.; Coluzza, C.; Dalchiele, E. A.; Decker, F.; Di Santo, G.; Flamini, A.; Funari, L.; Marrani, A. G. Surf. Sci. 2005, 573, 260.
-
(2005)
Surf. Sci.
, vol.573
, pp. 260
-
-
Zanoni, R.1
Cattaruzza, F.2
Coluzza, C.3
Dalchiele, E.A.4
Decker, F.5
Di Santo, G.6
Flamini, A.7
Funari, L.8
Marrani, A.G.9
-
30
-
-
0035801482
-
-
Di Bella, S.; Fragalà, I.; Ledoux, L; Zyss, J. Chem. - Eur. J. 2001,7, 3738.
-
(2001)
J. Chem. - Eur. J.
, vol.7
, pp. 3738
-
-
Di Bella, S.1
Fragalà, I.2
Ledoux, L.3
Zyss4
-
31
-
-
0030732057
-
-
Di Bella, S.; Fragalà, I.; Ledoux, I.; Diaz-Garcia, M. A.; Marks, T. J. J. Am. Chem. Soc. 1997, 119, 9550.
-
(1997)
J. Am. Chem. Soc.
, vol.119
, pp. 9550
-
-
Di Bella, S.1
Fragalà, I.2
Ledoux, I.3
Diaz-Garcia, M.A.4
Marks, T.J.5
-
33
-
-
0042567516
-
-
Cerofolini, G. F.; Galati, C.; Lorenti, S.; Renna, L.; Viscuso, O.; Bongiorno, C.; Raineri, V.; Spinella, C.; Condorelli, G. G.; Fragalà, I. L.; Terrasi, A. Appl. Phys. A 2003, 77, 403.
-
(2003)
Appl. Phys. A
, vol.77
, pp. 403
-
-
Cerofolini, G.F.1
Galati, C.2
Lorenti, S.3
Renna, L.4
Viscuso, O.5
Bongiorno, C.6
Raineri, V.7
Spinella, C.8
Condorelli, G.G.9
Fragalà, I.L.10
Terrasi, A.11
-
34
-
-
0942299947
-
-
Cerofolini, G. F.; Galati, C.; Reina, S.; Renna, L.; Viscuso, O.; Condorelli, G. G.; Fragalà, I. L. Mater. Sci. Eng. C 2003, 23, 989.
-
(2003)
Mater. Sci. Eng. C
, vol.23
, pp. 989
-
-
Cerofolini, G.F.1
Galati, C.2
Reina, S.3
Renna, L.4
Viscuso, O.5
Condorelli, G.G.6
Fragalà, I.L.7
-
35
-
-
2242439372
-
-
Briggs, D.; Seah, M. P., Eds; Wiley-VCH: Weinheim, Germany
-
Briggs, D. In Practical Surfaces Analysis; Briggs, D.; Seah, M. P., Eds; Wiley-VCH: Weinheim, Germany, 1995; Vol. 1, p 444.
-
(1995)
Practical Surfaces Analysis
, vol.1
, pp. 444
-
-
Briggs, D.1
-
38
-
-
33748805041
-
-
note
-
Actually, the amount of oxygen attributed to oxidized silicon (the band at 532.5 eV), when compared to that attributed to oxidized silicon (the band at 103 eV), indicates a slightly higher intensity ratio than the expected ratio of 2:1 (once corrected for the Wagner sensitivity factors). This may be attributed to the contribution of a slightly contamination of oxygen-containing molecules.
-
-
-
-
39
-
-
0001389308
-
-
Tolman, C. A.; Riggs, W. M.; Linn, W. J.; King, C. M.; Wendt, R. C. Inorg. Chem. 1973, 12, 2770.
-
(1973)
Inorg. Chem.
, vol.12
, pp. 2770
-
-
Tolman, C.A.1
Riggs, W.M.2
Linn, W.J.3
King, C.M.4
Wendt, R.C.5
-
40
-
-
0343971708
-
-
Clark, D. T.; Kilcast, D.; Adams, D. B.; Musgrave, W. K. R. J. Electron Spectrosc. Relat. Phenom. 1975, 6, 117.
-
(1975)
J. Electron Spectrosc. Relat. Phenom.
, vol.6
, pp. 117
-
-
Clark, D.T.1
Kilcast, D.2
Adams, D.B.3
Musgrave, W.K.R.4
-
41
-
-
0019622512
-
-
Wagner, C. D.; Davis, L. E.; Zeller, M. V.; Taylor, J. A.; Raymond, R. H.; Gale, L. H. Surf. Interface Anal. 1981, 3, 211.
-
(1981)
Surf. Interface Anal.
, vol.3
, pp. 211
-
-
Wagner, C.D.1
Davis, L.E.2
Zeller, M.V.3
Taylor, J.A.4
Raymond, R.H.5
Gale, L.H.6
-
42
-
-
0000503141
-
-
Briggs, D.; Seah, M. P., Eds; Wiley-VCH: Weinheim, Germany
-
(a) Seah M. P. In Practical Surfaces Analysis; Briggs, D.; Seah, M. P., Eds; Wiley-VCH: Weinheim, Germany, 1995; Vol. 1, p 201.
-
(1995)
Practical Surfaces Analysis
, vol.1
, pp. 201
-
-
Seah, M.P.1
-
43
-
-
26844513876
-
-
(b) Dube, A.; Chadeayne, A. R.; Sharma, M.; Wolczanski, P. T.; Engstrom, J. R. J. Am. Chem. Soc. 2005, 127, 14299.
-
(2005)
J. Am. Chem. Soc.
, vol.127
, pp. 14299
-
-
Dube, A.1
Chadeayne, A.R.2
Sharma, M.3
Wolczanski, P.T.4
Engstrom, J.R.5
-
44
-
-
18244407777
-
-
Killampalli, A. S.; Ma, P. F.; Engstrom, J. R. J. Am. Chem. Soc. 2005, 127, 6300.
-
(2005)
J. Am. Chem. Soc.
, vol.127
, pp. 6300
-
-
Killampalli, A.S.1
Ma, P.F.2
Engstrom, J.R.3
-
45
-
-
33748773418
-
-
note
-
(a) Actually, the estimated length of 1, upon HF-LANL2MB geometry optimization, is 25.7 Å, whereas the distance between the centroid of terminal alkenes and that of the chloride atoms is 21.0 Å.
-
-
-
-
46
-
-
14344256782
-
-
Di Bella, S.; Fragalà, I.; Leonardi, N.; Sortino, S. Inorg. Chim. Acta 2004, 357, 3865.
-
(2004)
Inorg. Chim. Acta
, vol.357
, pp. 3865
-
-
Di Bella, S.1
Fragalà, I.2
Leonardi, N.3
Sortino, S.4
-
48
-
-
0000502575
-
-
Nie, H. Y.; Shimizu, T.; Tokumoto, H. J. Vac. Sci. Technol., B1994, 12, 1843.
-
(1994)
J. Vac. Sci. Technol., B
, vol.12
, pp. 1843
-
-
Nie, H.Y.1
Shimizu, T.2
Tokumoto, H.3
-
49
-
-
0001620144
-
-
Hues, S. M.; Draper, C. F.; Colton, R. J. J. Vac. Sci. Technol., B 1994, 12, 2211.
-
(1994)
J. Vac. Sci. Technol., B
, vol.12
, pp. 2211
-
-
Hues, S.M.1
Draper, C.F.2
Colton, R.J.3
-
50
-
-
0003469907
-
-
Pohl, D. W., Courjon, D., Eds.; NATO ASI Series; Kluwer Academic: Dordrecht, The Netherlands
-
A detailed discussion of the mechanism of optical contrast observed in SNOM images can be found in Near Field Optics; Pohl, D. W., Courjon, D., Eds.; NATO ASI Series; Kluwer Academic: Dordrecht, The Netherlands, 1992; Vol. 262.
-
(1992)
Near Field Optics
, vol.262
-
-
-
51
-
-
21544436741
-
-
Betzig, E.; Finn, P. L.; Wiener, J. S. Appl. Phys. Lett. 1994, 60, 2484.
-
(1994)
Appl. Phys. Lett.
, vol.60
, pp. 2484
-
-
Betzig, E.1
Finn, P.L.2
Wiener, J.S.3
-
53
-
-
0032160884
-
-
Cricenti, A.; Generosi, R.; Barchesi, C.; Luce, M.; Rinaldi, M. Rev. Sci. Instrum. 1998, 69, 3240.
-
(1998)
Rev. Sci. Instrum.
, vol.69
, pp. 3240
-
-
Cricenti, A.1
Generosi, R.2
Barchesi, C.3
Luce, M.4
Rinaldi, M.5
|