Charge trapping in polymer transistors probed by terahertz spectroscopy and scanning probe potentiometry

Applied Physics Letters

Volumn 89, Issue 11, 2006, Pages

  Lloyd Hughes, J ^a   Richards, T ^b   Sirringhaus, H ^b   Castro Camus, E ^a   Herz, L M ^a   Johnston, M B ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC POTENTIAL; ELECTRON TRAPS; HOLE TRAPS; POLYMERS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SILICON; SPECTROSCOPIC ANALYSIS;

CHARGE TRAPPING; DIFFERENTIAL TERAHERTZ TRANSMISSION; GATE VOLTAGE; HOLE DENSITY;

TRANSISTORS;

EID: 33748701269     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2340057     Document Type: Article

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