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Volumn II, Issue , 2005, Pages 764-769

Statistical timing analysis using levelized covariance propagation

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORRELATION METHODS; INTEGRATED CIRCUITS; MONTE CARLO METHODS; NANOTECHNOLOGY; STATISTICAL METHODS; THRESHOLD VOLTAGE;

EID: 33646912201     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.279     Document Type: Conference Paper
Times cited : (52)

References (15)
  • 3
    • 0041633857 scopus 로고    scopus 로고
    • Computation and refinement of statistical bounds on circuit delay
    • A. Agarwal, D. Blaauw, V. Zolotov, and S. Vrudhula. Computation and refinement of statistical bounds on circuit delay. In DAC. 2003.
    • (2003) DAC
    • Agarwal, A.1    Blaauw, D.2    Zolotov, V.3    Vrudhula, S.4
  • 5
    • 0036474722 scopus 로고    scopus 로고
    • Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration
    • K. A. Bowman, S. G. Duvall, and J. D. Meindl. Impact of Die-to-Die and Within-Die Parameter Fluctuations on the Maximum Clock Frequency Distribution for Gigascale Integration. IEEE Journal of Solid-State Circuits, 37(2):183-190, 2002.
    • (2002) IEEE Journal of Solid-state Circuits , vol.37 , Issue.2 , pp. 183-190
    • Bowman, K.A.1    Duvall, S.G.2    Meindl, J.D.3
  • 6
    • 0346778721 scopus 로고    scopus 로고
    • Statistical timing analysis considering spatial correlations using a Single PERT-like traversal
    • H. Chang and S. S. Sapatnekar. Statistical Timing Analysis Considering Spatial Correlations using a Single PERT-like Traversal. In ICCAD. pages 621-625, 2003.
    • (2003) ICCAD , pp. 621-625
    • Chang, H.1    Sapatnekar, S.S.2
  • 8
    • 0348040110 scopus 로고    scopus 로고
    • Block-based static timing analysis with uncertainty
    • A. Devgan and C. Kashyap. Block-based Static Timing Analysis with Uncertainty. In ICCAD, pages 607-614, 2003.
    • (2003) ICCAD , pp. 607-614
    • Devgan, A.1    Kashyap, C.2
  • 9
    • 84989495069 scopus 로고
    • Timing verification and the timing analysis problem
    • R. B. Hitchcock. Timing verification and the timing analysis problem. In ACM Design Automation Conference, pages 594-604, 1982.
    • (1982) ACM Design Automation Conference , pp. 594-604
    • Hitchcock, R.B.1
  • 10
    • 4444279488 scopus 로고    scopus 로고
    • STAG: Statistical Timing Analysis with Correlation
    • J. Le, X. Li, and L. T. Pileggi. STAG: Statistical Timing Analysis with Correlation. In DAC. pages 343-348, 2004.
    • (2004) DAC , pp. 343-348
    • Le, J.1    Li, X.2    Pileggi, L.T.3
  • 11
    • 0034833288 scopus 로고    scopus 로고
    • Modeling and analysis of manufacturing variations
    • S. R. Nassif. Modeling and Analysis of Manufacturing Variations, In Custom Integrated Circuits Conference, pages 223-228, 2001.
    • (2001) Custom Integrated Circuits Conference , pp. 223-228
    • Nassif, S.R.1
  • 12
    • 0026106011 scopus 로고
    • Delay analysis of series-connected MOSFET circuits
    • T. Sakurai and R. Newton. Delay analysis of series-connected MOSFET circuits. IEEE JSSC, pages 122-131, 1991.
    • (1991) IEEE JSSC , pp. 122-131
    • Sakurai, T.1    Newton, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.