UltraScan: Using Time-Division Demultiplexing/Multiplexing (TDDM/TDM) with VirtualScan for test cost reduction

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 946-953

  Wang, Laung Terng ^a   Abdel Hafez, Khader S ^a   Wen, Xiaoqing ^b   Sheu, Boryau ^a   Wu, Shianling ^a   Lin, Shyh Horng ^a   Chang, Ming Tung ^a  

^a SYNTEST TECHNOLOGIES INC   (United States)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; DATA COMPRESSION; DEMULTIPLEXING; VIRTUAL REALITY;

SCAN PATTERNS; TEST APPLICATION TIME; VIRTUALSCAN COMPRESSION CIRCUITRY;

TIME DIVISION MULTIPLEXING;

EID: 33748511971     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584060     Document Type: Conference Paper

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