System embedded ADC calibration for OFDM receivers

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 53, Issue 8, 2006, Pages 1693-1703

  Oh, Yangjin ^a   Murmann, Boris ^a  

^a Stanford University   (United States)

Author keywords

Analog digital (A D) conversion; Calibration; CMOS integrated circuits; Communication standards; Parallel processing; Parameter estimation

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CALIBRATION; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC DISTORTION; ORTHOGONAL FREQUENCY DIVISION MULTIPLEXING; PARALLEL PROCESSING SYSTEMS; PARAMETER ESTIMATION; SIGNAL TO NOISE RATIO;

PSEUDORANDOM MODULATION SEQUENCES; TIME-INTERLEAVED ARRAY; ULTRA WIDEBAND SYSTEM;

SIGNAL RECEIVERS;

EID: 33747861377     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2006.879063     Document Type: Article

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