Crosstalk modeling for coupled RLC interconnects with application to shield insertion

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 14, Issue 6, 2006, Pages 641-646

  Zhang, Junmou ^a   Friedman, Eby G ^a  

^a University of Rochester   (United States)

Author keywords

Capacitive coupling; Crosstalk analysis; Decoupling technique; Inductive coupling; Resistance inductance capacitance (RLC) interconnect; Shield insertion

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; COUPLED CIRCUITS; ELECTRIC RESISTANCE; INDUCTANCE; INSTRUMENT ERRORS; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; VLSI CIRCUITS;

CAPACITIVE COUPLING; CROSSTALK ANALYSIS; DECOUPLING TECHNIQUE; INDUCTIVE COUPLING; RESISTANCE-INDUCTANCE-CAPACITANCE (RLC) INTERCONNECT; SHIELD INSERTION;

INTERCONNECTION NETWORKS;

EID: 33746915168     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2006.878223     Document Type: Article

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