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Volumn 634, Issue , 2001, Pages
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Dislocations in submicron grain size and nanocrystalline copper
a b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
CONDENSATION;
COPPER;
DISLOCATIONS (CRYSTALS);
FOURIER TRANSFORMS;
GRAIN SIZE AND SHAPE;
INERT GASES;
MATHEMATICAL MODELS;
STRAIN;
X RAY DIFFRACTION ANALYSIS;
LOMER COTTRELL TYPE DISLOCATIONS;
NANOCRYSTALLINE COPPER;
X RAY DIFFRACTION PEAK PROFILE ANALYSIS;
NANOSTRUCTURED MATERIALS;
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EID: 0034877026
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (22)
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