Rheological analysis of creep in hydrogenated amorphous carbon films

Thin Solid Films

Volumn 514, Issue 1-2, 2006, Pages 223-230

  Lemoine, Patrick ^a   Quinn, John Paul ^a   Maguire, Paul ^a   Papakonstantinou, Pagona ^a   Dougan, Niall ^a  

^a UNIVERSITY OF ULSTER   (United Kingdom)

Author keywords

Carbon; Creep; Fourier transform infrared spectroscopy; Raman scattering

Indexed keywords

DEFORMATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAPHITE; HYDROGENATION; RAMAN SCATTERING; RHEOLOGY; VAN DER WAALS FORCES;

BURGESS MODEL; CREEP DEFORMATION; HYDROGENATED AMORPHOUS CARBON FILMS; NANOINDENTATION;

AMORPHOUS FILMS;

EID: 33745762475     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.02.022     Document Type: Article

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