Correlation between luminescence properties and microstructure of hydrogenated amorphous carbon films investigated by X-ray diffraction and infrared ellipsometry

Solid State Communications

Volumn 111, Issue 6, 1999, Pages 293-298

  Godet, C ^a   Heitz, T ^a   Bouree J E ^a   Bouchet, B ^b   Dixmier, J ^c   Drevillon B ^a  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHEMICAL BONDS; CORRELATION METHODS; DEPOSITION; ELLIPSOMETRY; HYDROGENATION; INFRARED RADIATION; LIGHT MEASUREMENT; MICROSTRUCTURE; PHOTOLUMINESCENCE; PLASMA APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

INFRARED ELLIPSOMETRY;

AMORPHOUS FILMS;

EID: 0033538356     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(99)00216-1     Document Type: Article

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