A neutron and X-ray diffraction study of the influence of deposition conditions on the structure of a-C : H

Journal of Non-Crystalline Solids

Volumn 197, Issue 1, 1996, Pages 41-52

  Walters, J K ^a,e   Algar, C D ^a   Burke, T M ^a   Rigden, J S ^a   Newport, R J ^a   Bushnell Wye, G ^b   Howells, W S ^c   Sattel, S ^d   Weiler, M ^d   Ehrhardt, H ^d  

^a UNIVERSITY OF KENT   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^d Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^e UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACETYLENE; CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; CRYSTAL ATOMIC STRUCTURE; NEUTRON DIFFRACTION; X RAY DIFFRACTION;

AMORPHOUS HYDROGENATED CARBON FILM; AROMATIC GRAPHITIC BONDING; BEAM ENERGY EFFECT; DEPOSITION CONDITIONS; FAST ATOM SOURCE; HIGH RESOLUTION REAL SPACE NEUTRON DIFFRACTION; PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION; SINGLE:DOUBLE BOND RATIO;

AMORPHOUS FILMS;

EID: 0030130328     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00616-8     Document Type: Article

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