Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films

Journal of Applied Physics

Volumn 81, Issue 2, 1997, Pages 672-678

  Beghi, M G ^a   Bottani, C E ^a   Ossi, P M ^a   Lafford, T A ^b   Tanner, B K ^c  

^a POLITECNICO DI MILANO   (Italy)

^b Bede Scientific Instruments Ltd   (United Kingdom)

^c DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC WAVES; BRILLOUIN SCATTERING; COMPUTER SIMULATION; COPPER; ELASTICITY; GOLD; HARDENING; NICKEL; PHONONS; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION;

ELASTIC CONSTANTS; GUIDED ACOUSTIC MODES; INCIDENCE ANGLE; MODE MATCHING METHOD; X RAY REFLECTIVITY;

METALLIC FILMS;

EID: 0030837225     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364207     Document Type: Article

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