Effect of processing conditions and methods on residual stress in CeO2 buffer layers and YBCO superconducting films

Physica C: Superconductivity and its Applications

Volumn 442, Issue 2, 2006, Pages 124-128

  Xiong, Jie ^a   Qin, Wenfeng ^a   Cui, Xumei ^a   Tao, Bowan ^a   Tang, Jinlong ^a   Li, Yanrong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

CeO2 buffer layer; Residual stress; Substrate temperature; Thermal stress; YBCO superconducting film

Indexed keywords

CERIUM COMPOUNDS; PULSED LASER DEPOSITION; RESIDUAL STRESSES; SAPPHIRE; THERMAL STRESS; X RAY DIFFRACTION ANALYSIS; YTTERBIUM COMPOUNDS;

BUFFER LAYERS; CU SHEATHED MGB2 WIRES; SUBSTRATE TEMPERATURE; YBCO SUPERCONDUCTING FILM;

SUPERCONDUCTING FILMS;

EID: 33745584831     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2006.05.024     Document Type: Article

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