Microwave losses and structural properties of large-area YBa2Cu3O7 films on r-cut sapphire buffered with (001)/(111) oriented CeO2

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 1482-1485

  Zaitsev, Alexander G ^a   Wördenweber, Roger ^a   Ockenfuß, Georg ^a   Kutzner, Rolf ^a   Königs, Thomas ^a   Zuccaro, Claudio ^a   Klein, Norbert ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL ORIENTATION; ELECTRIC RESISTANCE; FILM GROWTH; FILM PREPARATION; MICROWAVES; OXIDE SUPERCONDUCTORS; SAPPHIRE; SUBSTRATES; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

CRITICAL TEMPERATURE; MICROWAVE SURFACE RESISTANCE;

SUPERCONDUCTING FILMS;

EID: 0031165315     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620853     Document Type: Article

References (18)

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