Influence of processing methods on residual stress evolution in coated conductors

Superconductor Science and Technology

Volumn 18, Issue 1, 2005, Pages 142-146

  Cheon, J H ^a   Shankar, P S ^a   Singh, J P ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEPOSITION; DIFFUSION; LANTHANUM COMPOUNDS; RESIDUAL STRESSES; SOL-GELS; TEXTURES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

COATED CONDUCTORS; COMPRESSIVE STRESSES; STRESS EVOLUTION; TEXTURED FILMS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 11844296735     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/1/022     Document Type: Article

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