On ageing and critical thickness of YBa2Cu3O7 films on Si with CeO2/YSZ buffer layers

Thin Solid Films

Volumn 338, Issue 1-2, 1999, Pages 224-230

  Tian, Y J ^a,b   Linzen, S ^a   Schmidl, F ^a   Matthes, A ^a   Schneidewind, H ^a   Seidel, P ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b YANSHAN UNIVERSITY   (China)

Author keywords

Laser ablation; Multilayers; Silicon; Stress

Indexed keywords

AGING OF MATERIALS; CRACK PROPAGATION; FRACTURE MECHANICS; LASER ABLATION; MULTILAYERS; OXIDE SUPERCONDUCTORS; SILICON; THERMAL STRESS; YTTRIUM BARIUM COPPER OXIDES;

BUFFER LAYERS;

SUPERCONDUCTING FILMS;

EID: 0032757508     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01086-4     Document Type: Article

References (29)

1. A. Mogro-Campero, L.G. Turner, Appl. Phys. Lett. 52 (1988) 1185.
2. S. Witanachchi, S. Patel, H.S. Kwok, D.T. Shaw, Appl. Phys. Lett. 54 (1989) 578.
3. A. Lubig, C. Buchal, W. Zander, B. Stritzker, Mater. Res. Symp. Proc. 169 (1989) 1149.
4. T. Inoue, Y. Yamamoto, S. Koyama, S. Suzuki, Y. Ueda, Appl. Phys. Lett. 56 (1990) 1332.
5. T. Venkatesan, E.W. Chase, X.D. Wu, A. Inam, C.C. Chang, F.K. Schokoohi, Appl. Phys. Lett. 53 (1988) 243.
6. A. Kumar, J. Narayan, Appl. Phys. Lett. 59 (1991) 1785.
7. Q.X. Jia, W.A. Anderson, Appl. Phys. Lett. 57 (1990) 304.
8. D.K. Fork, D.B. Fenner, T.H. Geballe, J. Appl. Phys. 68 (1990) 4316.
9. L. Méchin, J. Villégier, G. Rolland, F. Laugier, Physica C 269 (1996) 124.
10. S. Linzen, F. Schmidl, T. Schmauder, H. Schneidewind, P. Seidel, T. Köhler, in: P.L. Vincenzini (Ed.), Superconductivity and Superconducting Materials Technologies, Faenza, Techna, 1995, p. 273.
11. T. Matthée, J. Wecker, H. Behner, G. Friedl, O. Eibl, K. Samwer, Appl. Phys. Lett. 61 (1992) 1240.
12. X.D. Wu, A. Inam, M.S. Hegde, et al., Appl. Phys. Lett. 54 (1989) 243.
13. D.K. Fork, F.A. Ponce, J.C. Tramontana, T.H. Geballe, Appl. Phys. Lett. 58 (1991) 2294.
14. S. Miura, T. Yoshitaka, S. Matsubara, Y. Miasaka, N. Shohata, T. Satoh, Appl. Phys. Lett. 53 (1988) 1967.
15. c Superconductor Thin Films, North Holland, Amsterdam, 1992, p. 623.
16. D.K. Fork, D.B. Fenner, R.W. Barton, J.M. Phillips, G.A.N. Connell, J.B. Boyce, T.H. Geballe, Appl. Phys. Lett. 57 (1990) 1161.
17. C.A. Copetti, J. Schubert, W. Zander, H. Soltner, U. Poppe, C. Buchal, J. Appl. Phys. 73 (1993) 1339.
18. Y.J. Tian, S. Linzen, F. Schmidl, R. Cihar, P. Seidel, Supercond. Sci. Technol. 11 (1998) 59.
19. W. Prusseit, S. Corsépius, M. Zwerger, P. Berberich, H. Kinder, Physica C 201 (1992) 249.
20. M.D. Thouless, J. Am. Ceram. Soc. 73 (1990) 2144.
21. R.E. Jones, M.L. Basehore, Appl. Phys. Lett. 50 (1987) 725.
22. E.D. Specht, C.J. Sparks, A.G. Dhere, J. Brynestad, O.B. Cavin, D.M. Kroeger, H.A. Oye, Phys. Rev. B 37 (1988) 7426.
23. J.F. Shackelford, W. Alexander, J.S. Park, Material Science and Engineering Handbook, CRC, Boca Raton Press. FL, 1994, p. 340.
24. J.D. Jorgensen, M.A. Beno, D.G. Hinks, et al., Phys. Rev. B 36 (1987) 3608.
25. A.S. Raynes, S.W. Freiman, F.W. Gayle, D.L. Kaiser, J. Appl. Phys. 70 (1991) 5254.
26. W. Reichardt, L. Pintschovius, B. Hennion, F. Collin, Supercond. Sci. Technol. 1 (1988) 173.
27. F. Goerke, Physica C 245 (1995) 15.
28. S. Linzen, F. Schmidl, R. Cihar, L. Dörrer, P. Seidel, IOP Conf. Series 148 (1995) 1577.
29. S. Linzen, J. Kräuβlich, A. Köhler, P. Seidel, B. Freitag, W. Mader, Physica C 290 (1997) 323.