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Volumn 16, Issue 7, 2006, Pages 1307-1313

Development of a low temperature MEMS process with a PECVD amorphous silicon structural layer

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; ALUMINUM; AMORPHOUS SILICON; FABRICATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; STRESS ANALYSIS;

EID: 33745110928     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/16/7/027     Document Type: Article
Times cited : (28)

References (27)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.